Semiconductor And RF

High-Throughput Test Sets For RFIC, MEMS, And Production Reality

Production-grade test automation for semiconductor and RF manufacturers. Selected examples from our delivered work:

Global RF semiconductor manufacturer

BAW (Bulk Acoustic Wave) filter wafer probe test software at 150-millisecond cycle time (70ms acquisition with 80ms post-processing during prober indexing), the surrounding manufacturing test platform, and a multi-year CI/CD pipeline modernization for test software build and deployment automation.

Defense RF semiconductor, multi-year

Foundational LabVIEW test architecture for RFIC/MMIC semiconductor testing for military applications, a test data database, S-parameter characterization, gain compression testing, pulsed power measurement, and binning algorithms.

S-parameter ETL

Intelligent auto-discovery file converter that monitors a folder, parses arriving data, dynamically determines file type, and converts into common units for RF modeling database ingestion (long before AI was cool).

IC, MEMS, and optoelectronic production test

Test set and LabVIEW software for IC/MEMS semiconductor production, plus initial and ongoing manufacturing test capabilities and architecture consulting for optoelectronic device production.

Semiconductor fab safety

Test set for fire suppression enclosure cabinets that surround equipment using pyrophoric chemicals, with vortex containment rated to withstand a building fire for safe personnel evacuation.

First-responder two-way radio

Auto-calibration routines for RF tuning and a multi-year LabVIEW software architecture engagement for the two-way radio test platform sold to sheriff offices, police, and fire departments.

Industry Solution

BAW Filter Wafer Probe Test

Core BAW (Bulk Acoustic Wave) filter wafer probe test software achieving 150-millisecond cycle time, with 70ms acquisition and 80ms post-processing during prober indexing, plus the surrounding manufacturing test platform.

CI/CD For Test Software

Modernization of the client’s CI/CD pipeline by updating the continuous integration and deployment infrastructure for test software build and deployment automation, delivered as a multi-year engagement.

S-Parameter ETL Automation

An intelligent S-parameter file converter that monitors a folder, auto-discovers data files, dynamically determines file type, parses data, and converts into common units and format for RF modeling database ingestion. Fully automating S-parameter RF modeling ETL flows long before AI was cool.

Industry Solution

Defense MMIC/RFIC Test Architecture

Foundational LabVIEW test architecture for a defense RF semiconductor manufacturer’s RFIC/MMIC semiconductor testing for military applications, covering S-parameter characterization, gain compression testing, pulsed measurement, and binning algorithms for sorting and classifying devices.

Test Data Database

Test data database for storing and retrieving RFIC/MMIC measurement results and device characterization data, paired with the device binning algorithms used to sort and classify devices by measured performance parameters.

RF Production Test Framework

Core semiconductor test software framework for RF integrated circuit production testing and characterization for military applications, with pulse power measurement capabilities for MMIC/RFIC device performance under pulsed signal conditions.

What We Build In Semiconductor And RF

We have built and delivered production test automation across BAW filter wafer probe test (with 150-millisecond cycle times), defense MMIC/RFIC characterization, IC and MEMS manufacturing, optoelectronic device production test, semiconductor fab fire suppression cabinet test, and first-responder two-way radio test equipment, plus CI/CD pipeline modernization and S-parameter ETL automation for RF modeling workflows.

High-Throughput Production Test Platforms

BAW (Bulk Acoustic Wave) filter wafer probe test software achieving 150-millisecond cycle time with 70ms acquisition and 80ms post-processing during prober indexing
Test set and LabVIEW software for IC/MEMS semiconductor production, plus initial and ongoing manufacturing test capabilities for optoelectronic semiconductor production
Foundational LabVIEW test architecture for RFIC/MMIC semiconductor testing for military applications, with S-parameter, gain compression, and pulsed measurement modules

Two-Way Radio And Auto-Calibration

Auto-calibration routines for two-way radio test equipment, enabling automated RF circuitry tuning and optimization for first-responder communications equipment
Multi-year software architecture consulting and ongoing development for the LabVIEW-based two-way radio test and calibration platform sold to sheriff offices, police departments, and fire departments
Gain compression and S-parameter characterization modules for RF integrated circuit amplifier performance testing

CI/CD And Build Pipeline Modernization

CI/CD pipeline modernization for a global RF semiconductor manufacturer, updating the continuous integration and deployment infrastructure for test software build and deployment automation
Software consulting on test system architecture and development strategy for optoelectronic devices
Pulse power measurement capabilities for characterizing MMIC/RFIC device performance under pulsed signal conditions

Data Integrity And Yield Visibility

Test data database for storing and retrieving RFIC/MMIC measurement results and device characterization data
Binning algorithms for sorting and classifying MMIC/RFIC devices based on measured performance parameters
Intelligent S-parameter file converter for RF modeling database ingestion across multiple file formats

Why Semiconductor And RF Test Is Different

Cycle Time Matters

BAW filter wafer probe test at 150-millisecond cycle time (70ms acquisition, 80ms post-processing during prober indexing) leaves no slack for software bottlenecks. We architect to the measurement physics and prober motion budget, then modernize the CI/CD pipeline so test software updates ship cleanly.

Defense RF Longevity

Our multi-year engagement with a defense RF semiconductor manufacturer built the foundational LabVIEW test architecture, a test data database, S-parameter characterization, gain compression testing, pulsed signal measurement, and binning algorithms for military RFIC/MMIC programs. Multi-year programs require architectures that stay maintainable for years.

Manufacturing Rigor Meets Defense Requirements

Semiconductor manufacturing rigor meets defense requirements. We bring production floor discipline to RF characterization and bring RF measurement expertise to high-volume manufacturing. That intersection is where calibration automation, data integrity, and fleet management converge.

How We Work With Semiconductor Teams

We build production test automation, calibration systems, and deployment infrastructure for semiconductor and RF manufacturers, then deliver documentation, training, and handoff so your team can sustain it independently.

Production-First Discovery

We start on the production floor: how many tools, what uptime targets, what calibration cadence, how data flows to MES and yield systems, and what operators actually deal with day to day.

Architect For Scale

We architect to the cycle-time budget of the prober (150-millisecond cycle time on the BAW filter wafer probe, with 70ms acquisition and 80ms post-processing) and the V&V demands of military RFIC/MMIC test, then modernize the CI/CD pipeline so test software updates ship cleanly.

Deliver And Transfer

We deliver working production systems with documentation, training, and full knowledge transfer. Your team sustains it independently, with optional ongoing support for new device variants, fleet expansions, and rollout management.

MEMS Manufacturing Test Set

Production test automation for MEMS devices, integrating precision measurement with automated handling and data collection for high-volume manufacturing environments.

Semiconductor Fab Fire Suppression Cabinet Test Set

Test automation for pyrophoric chemical containment and vortex suppression systems used in semiconductor fabrication facilities. Safety-critical validation ensuring reliable operation under emergency conditions.

Two-Way Radio Test Equipment

Auto-calibration and production test for first responder two-way radio equipment. Five-year software architecture engagement covering automated calibration, RF characterization, and fleet deployment of test software.

CI/CD Pipeline Modernization For RF Semiconductor Test Software

Modernized the CI/CD pipeline at a global RF semiconductor manufacturer by updating the continuous integration and continuous deployment infrastructure for test software build and deployment automation.

BAW Filter Wafer Probe Test At 150-Millisecond Cycle Time

Developed the core BAW (Bulk Acoustic Wave) filter wafer probe test software achieving 150-millisecond cycle time, with 70ms acquisition and 80ms post-processing during prober indexing. Part of the broader BAW filter wafer probe manufacturing test platform delivered to a global RF semiconductor manufacturer.

Why Us

We bring production floor scale, defense-grade RF measurement expertise, and long-term architectural discipline to every semiconductor and RF engagement.

Throughput

BAW filter wafer probe test software at 150-millisecond cycle time, with 70ms acquisition and 80ms post-processing during prober indexing.

Resilient

Auto-discovery S-parameter file converter monitors a folder, parses arriving data files, dynamically determines file type, and converts into common units and format for RF modeling database ingestion.

Auto-Calibration

Auto-calibration routines for two-way radio test equipment that automate RF circuitry tuning and optimization for first-responder communications hardware.

CI/CD-Ready

Modernized CI/CD pipeline for a global RF semiconductor manufacturer’s test software, updating the build and deployment infrastructure across a multi-year engagement.

Data Storage

Test data database for storing and retrieving RFIC/MMIC measurement results and device characterization data, paired with binning algorithms for sorting devices by performance.

Safety-Critical

Test set for fire suppression enclosure cabinets used in semiconductor wafer fabrication facilities, surrounding equipment with pyrophoric chemicals that combust on contact with air, and rated to withstand a building fire for safe personnel evacuation.

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Need To Unblock Throughput Or De-Risk Updates?

Bring us the test platform that is slowing the line or making releases scary. We’ll map the risks, modernize the architecture, and deliver a maintainable path forward with the artifacts your team needs to sustain it.